Abstract
Equilibrium helium films adsorbed on solid substrates are investigated. Due to their thickness these films are mainly in the retardation regime where the influence of the roughness of the substrates, δ(x), can be strong enough to be observed. For the definition of δ(x) we use a simple corrugation model. This model is supported by experimental results using the surface plasmon resonance technique to determine the thickness of helium films grown on different Ag surfaces.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
