Abstract
Fractal structures of Au with an average dimension of 1.69±0.06 with concomitant growth of epitaxial gold silicide islands have been observed in Au thin films prepared by vacuum evaporation of Au on bromine-passivated Si(111) substrates and subsequent annealing around the Au Si eutectic temperature. When a thin (native) silicon oxide layer is present at the interface, neither the epitaxial islands nor the Au fractals are observed. Results of simulations based on diffusion-limited-aggregation using Witten-Sander model agree with the measured dimension. The observed fractal structures are not isotropic. The directional growth of the fractal patterns is apparently related to the shape and alignment of the silicide islands.
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