Abstract
As part of an effort to develop a new, non-vacuum-processed substrate for high current superconducting films, thin films of LaAlO3 and NdAlO3 were deposited on biaxially textured (100) nickel substrates using a solution deposition technique. On heating to 1150°C in Ar-4% H2 for 1 h, epitaxial films were obtained. Out-of-plane alignment was confirmed by obtaining rocking curves of the (002) plane of the LaAlO3 (full width at half-maximum (fwhm) = 7.2°) and the NdAlO3 (fwhm = 5.8°) films. In-plane alignment was demonstrated by obtaining phi scans of the (110) plane of the LaAlO3 (fwhm = 13.4°) and the NdAlO3 (fwhm = 8.8°) films. Grain alignment in the films is approximately equivalent to the alignment of the Ni substrate. Analysis of pole figures indicated that in both films there are two in-plane orientations present, the major being (001)[100] and the minor (001)[110].
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