Abstract
Pulsed Laser Deposition technique was used to engineer heterostructures of Yttrium-stabilized Zirconia (YSZ) and Gadolinium-doped Ceria (GDC) on perovskite substrates like Neodymium Gallate (NGO) and Strontium Titanate (STO). Epitaxial superlattices of the same number of layers of both materials were deposited with each block thickness as thin as 2 unit cells up to 30 unit cells. X-ray diffraction (XRD) investigation of the (002) symmetrical reflection allowed to evaluate the amount of material deposited in each layer constituting the superlattices. (113) asymmetrical reflections were analyzed to investigate strain effects on YSZ and GDC lattice parameters, evidencing the cube on cube growth of these films.
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