Abstract
The dependence of substrates on the epitaxial relationships of vapor deposited thin films of p-sexiphenyl(p-6P)was investigated by X-ray diffractmetry. The cleaved(001)surfaces of single crystals of NaCl, KCl and KBr were used for the substrate. The temperature dependence of the film structure was also examined between 50°C and 170°C. The epitaxial relationships of both standing and lying orientations were determined for the films grown on each substrate. The observed complex patterns of in-plane orientations were explained in terms of misfit ratio.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
