Abstract
Metal/ceramic interfaces have become important for advanced technologies in a variety of ways. To effectively tailor their properties, it is important to understand the mechanisms which govern the structural formation of the systems during deposition or post-deposition processing. Here, results on epitaxial re-crystallization of the Ni/MgO(0 0 1) interfaces are reported: (i) as deposited, the Ni films were grown on the MgO(0 0 1) substrates epitaxially, (ii) consecutive thermal annealing incited the process of re-crystallization, which led to the substantial improvement of their crystalline quality. The restructuring proceeded in a non-linear way, indicating that an intricate structural evolution was triggered in the system. Based on the results of the X-ray diffraction and Rutherford backscattering/channeling, the effect of thermal processing on the structural transformation of the Ni/MgO(0 0 1) interface is discussed in this paper.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
