Abstract
We present a model that describes the epitaxial quality of YBa 2Cu 3O 7 films by three parameters — the c-axis oriented fraction of the film, its degree of in-plane orientation and the degree of in-plane orientation of the remaining a-axis oriented fraction. These parameters can be specified by the relative phonon intensities in polarized Raman spectra. We have determined the epitaxy parameters of a-axis and c-axis oriented laser-deposited YBa 2Cu 3O 7 films on MgO (100) substrates. The accuracy of these parameters has been tested by performing Raman measurements at various rotation angles. The ratio of the intensities of the B 2g and B 3g modes observed on the a-axis oriented film indicates that a-axis growth is preferred to b-axis growth.
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