Abstract
Epitaxially grown Pb(Zr,Ti)O 3 thin films were prepared on LaAlO 3 (100) substrates by the dipping–pyrolysis (DP) process using metal naphthenates as starting materials. Homogeneous Pb–Zr–Ti solutions with toluene were spin-coated onto the substrates and pyrolyzed at 500°C. Highly oriented Pb(Zr,Ti)O 3 films confirmed by X-ray diffraction (XRD) θ–2 θ scans were obtained by annealing at 750°C in air. The XRD pole-figure analysis and reciprocal space mapping of the resulting 0.6 μm films showed that the film comprising the c-axis oriented tetragonal phase have an epitaxial relationship with the LaAlO 3 substrates.
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