Abstract
The epitaxial lateral overgrowth (ELO) was performed on {0 0 1}, {1 1 1}A,B and {1 1 0} oriented InP by liquid-phase epitaxy at constant growth temperature (450–650°C). According to the observations of cross-sectional shape, the orientation dependence of the vertical growth rate was determined to be {1 1 0}>{1 1 1}A,B>{1 0 0} under the present experimental conditions. The etch pit density in the ELO layer was lower than on openings. In PL mapping observations, PL properties were improved on the ELO layer.
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