Abstract
Abstract The epitaxial relationships of vapor-deposited thin films of pentacene on anthracene single crystal were investigated by X-ray diffractometry. The in-plane and out-of-plane structures of the thin films were investigated using a four-axis X-ray diffractometer. The thin-film phase of pentacene was confirmed in the deposited films, and the epitaxial relationship was determined. Uniaxial in-plane orientation was observed as well as the orientation of substrate normal direction. The mechanism of epitaxy is discussed in terms of lattice matching in [1 1 0] direction.
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