Abstract

Understanding and controlling the growth structures of molecular heterojunctions are important for the pursuit of highly efficient organic semiconductor devices. In this study, a well-defined molecular heterojunction was constructed by the deposition of an n-type organic semiconductor molecule, perfluorinated copper phthalocyanine (F16CuPc), on single-crystals of a typical p-type material, copper phthalocyanine (CuPc). The heterojunction was characterized using synchrotron radiation surface X-ray diffraction techniques to unveil the epitaxial growth of crystalline thin-films of F16CuPc on the CuPc surface. The inter-lattice relationships between F16CuPc and CuPc deduced from the present results imply that the in-plane orientation of the F16CuPc crystal lattice was predominantly governed by the molecular-level alignments of the π-backbones of the F16CuPc and CuPc molecules at the nucleation center for crystal growth at the interface.

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