Abstract
Epitaxial growth of CeO2 and yttria-stabilized ZrO2 (YSZ) double layer films has been successfully carried out on biaxially textured nickel substrates at a temperature between 400 and 600 °C using electrostatic spray assisted vapour deposition method. The structure of the double layer was characterized by X-ray diffraction and scanning electron microscopy. The results show that highly oriented CeO2/YSZ double buffer films were formed epitaxially onto biaxially textured Ni substrates. The orientation relationships between YSZ layer and Ni substrate are 001YSZ//001Ni and 110YSZ//100Ni, while the orientation relationships between CeO2 and YSZ are 001CeO2//001YSZ and 100CeO2//100YSZ.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
