Abstract
The morphology and atomic structure of C60 fullerene films on the Bi(0001)/Si(111)−7 × 7 surface with different coverages have been studied by scanning tunneling microscopy and spectroscopy and low-energy electron microscopy in high vacuum. It is shown that the most favorable sites for nucleation of C60 islands are double steps and domain boundaries on the surface of epitaxial Bi film.
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