Abstract
ABSTRACTSpin dependent tunneling junctions with epitaxially grown underlayers have been investigated to examine the possibility of achieving very flat and uniform barrier layers. Pt/Ni80Fe20 /Fe50Mn50/Ni80Fe20layers were deposited on sapphire (0001) substrates at different temperatures and monitored by in-situ reflection high energy electron diffraction (RHEED). The surface morphology has been found to depend strongly on the growth temperature. X-ray diffraction and magnetic hysteresis loop measurements were also performed to characterize the film structures
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