Abstract

Single-phase Ni0.92Mn1.08As films with strained C1b symmetry are grown on GaAs (001) substrates. In addition, a preferred epitaxial configuration of (110)-orientated Ni0.92Mn1.08As on (001)-orientated GaAs is revealed by synchrotron radiation measurement. The magnetic properties of the films are found to be significantly influenced by the growth temperature and the optimized growth temperature is determined to be ∼370°C. According to the results of x-ray absorption spectroscopy, these phenomena can be attributed to the variation of the local electronic structure of the Mn atoms. Our work provides useful information for the further investigations of NiMnAs, which is a theoretically predicted half-metal.

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