Abstract
Highly c-axis oriented, single crystal films of Co/sub 1-x/Cr/sub x/ have been grown epitaxially on mica substrates by e-beam evaporation. The method, using a Ru underlayer, is simple and applicable to similar c-axis oriented, large area growth of the wide range of Co alloys suitable for perpendicular recording. The films show narrow peak widths in X-ray diffraction (/spl Delta//spl Theta//sub 00.2//spl sim/1.0-1.5/spl deg/) and their magnetic properties are composition dependent. Moreover, for any given Cr concentration, these single crystal films exhibit the largest saturation magnetization when compared with either sputtered/evaporated samples or films grown under identical conditions on glass/silicon substrates. It is shown that this enhanced M/sub s/ is directly correlated with the dispersion of the c-axis about the film normal and their narrowest values are observed for these epitaxially grown films. X-ray microanalysis shows some inter/intra-granular variation in Cr content, but systematic segregation trends appropriate for explaining these results have not yet been observed.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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