Abstract
The epitaxial growth of thin organic films (perylenetetracar☐ylic dianhydride and perylene) on an inorganic semiconductor surface (Si(111)) was studied by near-edge X-ray absorption fine structure and angle-resolved ultraviolet photoelectron spectroscopy using synchrotron radiation. By comparison with results obtained from a perylene single crystal, information about orientation and order of the molecular film and about the adsorbate-substrate interaction could be derived.
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