Abstract

AbstractElectrical measurements are performed on a bottom‐gate bottom‐contact organic thin‐film transistor with 2,8‐difluoro‐5,11‐bis(triethylsilylethynyl) anthradithiophene (diF‐TES ADT) (diF‐TES ADT) as the active layer, varying the relative humidity of the environment surrounding the transistor. The results strongly indicate that water negatively impacts the electrical performance of the transistor and that the ingress of water is dynamic provided that the organic semiconductor layer is not encapsulated. It is found that the change can be reversed and the performance restored by removing the source of water. The drain current and threshold voltage of the transistor varied linearly when the relative humidity is changed from 35% to 7%, suggesting that the transistor can be used as a humidity sensor.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call