Abstract
Fundamental electrical and optical properties of strained wurtzite InGaN/GaN-based quantum-well light-emitting diodes are calculated based on the Rashba–Sheka–Pikus Hamiltonian in the vicinity of the Γ point. It is found that the strain and the strain-induced piezoelectric field significantly alter the subband structure and determines the output intensity of the nitride quantum well light emitting diodes. For the case with high In composition (≳0.2), the calculation also supports the possibility of strain relaxation in the quantum well. Coupled with an optimized set of parameters, our theoretical model provides an excellent agreement with the available experimental data over a wide range of In composition (0–0.5).
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