Abstract
We present the analysis of multiplicity distributions of charged secondary particles produced in minimum bias and central interactions of $^{32}\mathrm{S}$ and $^{16}\mathrm{O}$ at 200A GeV, $^{16}\mathrm{O}$ at 60A GeV, $^{28}\mathrm{Si}$ at 14.5A GeV, and protons at 800 GeV with nuclear emulsion in terms of the information entropy and higher generalized fractal dimensions. Comparisons of the $^{28}\mathrm{Si}$ data with Monte Carlo model venus and $^{32}\mathrm{S}$ data with fritiof model are also presented.
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