Abstract
We present a novel quantum interferometric technique to perform ellipsometric measurements. Classical ellipsometric measurements are limited in their accuracy by virtue of the need for an absolutely calibrated source and detector. Mitigating this limitation requires the use of a well-characterized reference sample. Our technique relies on the use of a non-classical optical source, namely polarization-entangled twin photons generated by spontaneous parametric down-conversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. We have demonstrated that entangled-photon ellipsometry eliminates the necessity of constructing an interferometer altogether and is thereby self-referencing. The underlying physics that leads to this remarkable result is the presence of fourth-order (coincidence) quantum interference of the photon pairs in conjuction with polarization entanglement.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
