Abstract

Deep learning has emerged as a technique of choice for rapid feature extraction across imaging disciplines, allowing rapid conversion of the data streams to spatial or spatiotemporal arrays of features of interest. However, applications of deep learning in experimental domains are often limited by the out-of-distribution drift between the experiments, where the network trained for one set of imaging conditions becomes sub-optimal for different ones. This limitation is particularly stringent in the quest to have an automated experiment setting, where retraining or transfer learning becomes impractical due to the need for human intervention and associated latencies. Here we explore the reproducibility of deep learning for feature extraction in atom-resolved electron microscopy and introduce workflows based on ensemble learning and iterative training to greatly improve feature detection. This approach allows incorporating uncertainty quantification into the deep learning analysis and also enables rapid automated experimental workflows where retraining of the network to compensate for out-of-distribution drift due to subtle change in imaging conditions is substituted for human operator or programmatic selection of networks from the ensemble. This methodology can be further applied to machine learning workflows in other imaging areas including optical and chemical imaging.

Highlights

  • Electron and scanning probe microscopies have emerged as primary techniques for exploring the micro, nano, and atomicscale worlds[1,2,3]

  • In atomically resolved scanning transmission electron microscopy (STEM) or scanning tunneling microscopy (STM) the attention of the researcher has been focused on the presence of large-scale morphological features such as surfaces and interfaces, localized or extended defects, with the conclusions on the physics and chemistry of materials driven by these qualitative observations

  • ELIT workflow The classical deep learning (DL) workflow consists of preparing a single labeled training set, selecting appropriate neural network architecture, transitions, the ensemble learning (EL) can be used for improved robustness and for providing uncertainty estimates of predicted values for each point

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Summary

Introduction

Electron and scanning probe microscopies have emerged as primary techniques for exploring the micro-, nano-, and atomicscale worlds[1,2,3]. Multiple examples of the imaging of materials classes ranging from metals and semiconductors to biological and macromolecular systems are abound, with the microscopic tools becoming the linchpins of academic and industrial laboratories throughout the world[1,4,5,6] This rapid progress in imaging techniques have further transformed many imaging areas from largely qualitative to quantitative. The progress in high-resolution imaging allowed quantitative information on the materials structure to be obtained, including the positions of the atomic nuclei in STEM, the center of mass of electronic density of states in STM, etc. This information in turn is related to the fundamental physics and chemistry of materials, and several examples of quantitative studies of materials physics from atomically resolved quantitative observations are available, including mapping of polarization fields[7,8,9,10,11,12], octahedra tilts[13,14,15,16], and strains in (S) TEM17,18 and surface distortions in STM19

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