Abstract
A scanning Kelvin probe technique is used to study the influences of the enriched alloy layers on the corrosion behavior of surface-treated, sputtering-deposited Al-0.7at.%Cu and Al-1.0at.%Au alloys. The alloys were etched in sodium hydroxide solution to produce the enriched layers of copper and gold respectively at the alloy/oxide interface. Volta potential measurements were performed for specimens in both the as-deposited and the alkaline-etched conditions in a humid air atmosphere. The results show the same increasing tendency with increase of enrichment observed in conventional measurements of the corrosion potential in bulk aqueous media. The findings support the key role played by enriched alloy layers in the electrochemical behavior of aluminum alloys.
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