Abstract
Two-photon excited fluorescence (TPEF) has become a standard technique in modern microscopy but it is still affected by photo-damage of the probe owed to high excitation intensities. This work reports on utilizing the photon bunching effect in thermal light to enhance the efficiency of TPEF under continuous wave excitation. A super-luminescence diode (SLD) was used as thermal light source and compared it to coherent excitation from a DFB diode laser emitting at the same wavelength. The degree of second order coherence g <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">(2)</sup> of both sources was measured. The SLD showed photon bunching with g <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">(2)</sup> = 1.90±0.2 as expected for thermal light, while the DFB diode laser emitted coherent light exhibiting no photon bunching at g <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">(2)</sup> = 1.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
