Abstract

In this work, (20-x)MgO–20Al2O3–56SiO2–4B2O3-xCuO (x = 0, 0.25, 0.5, 0.75, 1, 1.25 mol%) glass-ceramics were synthesized by solid-state reaction method. The crystallization, microstructure, thermal and dielectric properties of (20-x)MgO–20Al2O3–56SiO2–4B2O3-xCuO glass-ceramics was discussed in detail. It was demonstrated that the CuO lowers the crystallization temperature of α-cordierite and promotes the crystallization process of MgO–Al2O3–SiO–B2O3 glass-ceramics. Thus, the crystallization showed a substantial influence on the dielectric properties, as evidenced by an elevation in dielectric constant and a decrease in dielectric loss. Specifically, with the addition of 0.5 mol% CuO, the MgO–Al2O3–SiO–B2O3 glass-ceramics sintered at 1050 °C shows excellent properties of: εr = 5.04, tanδ = 2.2 × 10-4, κ = 3.4 W/mK and α = 1.75 × 10-6/°C. These works provide valuable insights into the design and development of (20-x)MgO–20Al2O3–56SiO2–4B2O3-xCuO glass-ceramics with tailored properties for structure/function integration in the electronics industry.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.