Abstract
We tested the feasibility of improving the sensitivity of CR-39 plastic detectors to relativistic ions by etching them in a mixture of 6.5N KOH and 6.25N NaOH. We examined the variation in sensitivity with fractional content of KOH in the mixed KOH + NaOH etchant at 60°C, by using a beam of 200 A GeV 32S at CERN SPS. We find that the detector response reaches a maximum when 6.5N KOH:6.25N NaOH ∼ 1:3 at 60°C. At the peak ratio, the detection threshold of CR-39 is one charge unit lower than those obtained from other etchants. Measurements made with an automated scanning system of etch pits developed in different etchants lead roughly to the same charge resolution σ Z = 0.10 ± 0.02 charge unit for one pair of etch pit measurements in the range 6 ≤ Z ≤ 16 at a sampling distance L s∼47–57 μm.
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