Abstract

Bi2Te3-based thermoelectric materials are widely used in solid-state refrigeration near room temperature. However, the room temperature figure of merit (zT) of n-type Bi2Te3-based polycrystals produced by once sintering is always lower than 0.8. Herein, low-angle grain boundaries (LAGBs) are introduced in n-type Bi2Te2.7+xSe0.3 by a simple step-hot-pressing procedure (once sintering) and well characterized by scanning transmission electron microscopy. LAGBs consist of dislocation arrays that can effectively scatter the medium-frequency phonons and thus suppress the lattice thermal conductivity. Although LAGBs also serve as scattering centers of low-energy electrons and deteriorate the carrier mobility, they could contribute to the enhanced Seebeck coefficient owing to the increased scattering factor. Overall, the samples with LAGBs own lower electronic thermal conductivity at the same power factor level. Finally, a high room temperature zT of 0.94 is obtained in n-type Bi2Te2.7Se0.3, which is comparable to those produced by multiple-time sintering. Moreover, step-hot-pressing is also found to be effective in promoting the room temperature zT of p-type Bi2Te3-based polycrystals. This work puts forward a new and simple method to construct LAGBs in Bi2Te3-based alloys that enhances their zTs, and sheds light on the underlying mechanisms about how the LAGB affects the electrical and thermal transport properties.

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