Abstract
Enhancing Data Storage Reliability and Error Correction in Multilevel NOR and NAND Flash Memories through Optimal Design of BCH Codes
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https://doi.org/10.1142/s0218126624502256
Copy DOIPublication Date: Jan 31, 2024 |
Enhancing Data Storage Reliability and Error Correction in Multilevel NOR and NAND Flash Memories through Optimal Design of BCH Codes
Join us for a 30 min session where you can share your feedback and ask us any queries you have