Abstract

Face recognition technology's excellent accuracy and non-intrusiveness have made it a major player in the attendance management space. This research study presents an advanced method of tracking attendance through the integration of a Face Recognition System (FRS) with Linear Discriminant Analysis (LDA) and Local Binary Pattern (LBP) histogram analysis. The architecture of the suggested attendance system is described in the study, with an emphasis on how LDA and LBP techniques are used to increase the accuracy of face feature extraction and recognition. Through the use of LDA, the system improves face data's discriminative strength, producing attendance records that are more trustworthy. Robust facial texture and pattern identification are simultaneously made possible by LBP histogram analysis, particularly in a variety of environmental settings. To sum up, this study advances biometric attendance systems by demonstrating how LDA and LBP histogram analysis may improve the precision and dependability of face recognition systems used for attendance tracking

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