Abstract
This paper reports on the observation of substantial rotation and reflection enhancements with thin magnetic films evaporated on the base of high index prisms with films of suitable index on only the air side of the magnetic thin film. Angles of incidence at the prism-magnetic thin-film interface were near the critical angle for total internal reflection. The magnetic film thickness and the thicknesses and indices of the dielectrics were obtained with the help of a computer program which calculated the reflection coefficients as well as the Kerr rotations and energy mode transfer. Enhancements of rsp up to a factor of 20 were obtained.
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