Abstract
The surface-roughness model, which describes the surface impedance of potassium as a function of the strength of the magnetic field normal to the surface, is used here to calculate the deep-field enhancement factor --- i.e., the amount by which the field deep in the bulk of a rough-surfaced sample exceeds that in the bulk of a diffuse-surfaced sample. Having obtained this factor, we recalculate the change in surface impedance caused by Fermi-liquid effects, using the enhanced field in the calculation rather than the original diffuse field. This procedure should yield the change in surface impedance caused by correlations among the conduction electrons in a sample having a rough surface. We find that the peak in surface resistance calculated in this way is fully comparable in size with what has been observed, and that its location is very close to $\frac{{\ensuremath{\omega}}_{c}}{\ensuremath{\omega}}={(1+{A}_{2})}^{\ensuremath{-}1}$, where ${A}_{2}$ is the second Landau-theory Fermi-liquid parameter. The value of ${A}_{2}$ deduced in this way is -0.03, in agreement with the value deduced by Platzman, Walsh, and Foo from their theory and observation of the high-frequency waves.
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