Enhancement of Synaptic Performance through Synergistic Indium Tungsten Oxide-Based Electric-Double-Layer and Electrochemical Doping Mechanisms

Abstract

This study investigated the potential of indium tungsten oxide (IWO) channel-based inorganic electrolyte transistors as synaptic devices. We comparatively analyzed the electrical characteristics of indium gallium zinc oxide (IGZO) and IWO channels using phosphosilicate glass (PSG)-based electrolyte transistors, focusing on the effects of electric-double-layer (EDL) and electrochemical doping. The results showed the superior current retention characteristics of the IWO channel compared to the IGZO channel. To validate these findings, we compared the DC bias characteristics of SiO2-based field-effect transistors (FETs) with IGZO and IWO channels. Furthermore, by examining the transfer curve characteristics under various gate voltage (VG) sweep ranges for PSG transistors based on IGZO and IWO channels, we confirmed the reliability of the proposed mechanisms. Our results demonstrated the superior short-term plasticity of the IWO channel at VG = 1 V due to EDL operation, as confirmed by excitatory post-synaptic current measurements under pre-synaptic conditions. Additionally, we observed superior long-term plasticity at VG ≥ 2 V due to proton doping. Finally, the IWO channel-based FETs achieved a 92% recognition rate in pattern recognition simulations at VG = 4 V. IWO channel-based inorganic electrolyte transistors, therefore, have remarkable applicability in neuromorphic devices.