Abstract
Internal Heavy Atom Effect In article number 2104646, Jihoon Lee, Min Chul Suh, Seunghyup Yoo, and co-workers show how incorporating the internal heavy atom (IHA) effect can impact the reverse intersystem crossing (RISC) and device performance. The spectroscopic and theoretical results indicate that a fast RISC may not be the sole factor important for reducing efficiency roll-off and that the spin-flip cycles considering both T1 → S1 and S1 → T1 should be carefully taken into account to derive a complete picture of the IHA effect on efficiency roll-off behavior.
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