Enhancement of measurement sensitivity in determination of changes in the shape of a wavefront by holographic lateral-shearing interferometry

Abstract

A method for increasing measurement sensitivity in the visualization of dynamics of changes in wavefront shape with the use of holographic lateral-shearing interferometry is considered. At the first stage of this method, a photograph of a reference shear interferogram obtained with tuning to closely spaced fringes is recorded under linear conditions. After chemical treatment, the photograph of the reference shear interferogram is installed in exactly its initial position. At the second stage, a series of photographs of lateral-shear interferograms of the wavefront under study is recorded under nonlinear conditions using the photograph of the reference interferogram. The photographs of the lateral-shear interferograms are optically processed by two coherent beams with selection of the highest diffraction orders, which makes it possible to visualize the dynamic component of the wavefront deformation with an increase in the measurement sensitivity (the static component is excluded in this case). The effect of the degree of nonlinearity of photograph recording on the range in which the measurement sensitivity can be controlled during the optical processing of a pair of matched photographs or one double-exposure photograph of interferograms recorded at different values of a lateral shift is analyzed.