Abstract
PbZr0.35Ti0.65O3 (PZT), PbZrO3 (PZO), and PZT/PZO ferroelectric/antiferroelectric multilayer films were prepared on a Pt/Ti/SiO2/Si substrate using the sol–gel method. Microstructures and physical properties such as the polarization behaviors, leakage current, dielectric features, and energy-storage characteristics of the three films were systematically explored. All electric field-dependent phase transitions, from sharp to diffused, can be tuned by layer structure, indicated by the polarization, shift current, and dielectric properties. The leakage current behaviors suggested that the layer structure could modulate the current mechanism, including space-charge-limited bulk conduction for single layer films and Schottky emission for multilayer thin films. The electric breakdown strength of a PZT/PZO multilayer structure can be further enhanced to 1760 kV/cm, which is higher than PZT (1162 kV/cm) and PZO (1373 kV/cm) films. A recoverable energy-storage density of 21.1 J/cm3 was received in PZT/PZO multilayers due to its high electric breakdown strength. Our results demonstrate that a multilayer structure is an effective method for enhancing energy-storage capacitors.
Highlights
Accepted: 20 August 2021As electronic components, dielectric capacitors have received extensive investigation from researchers due to their ability to release and store charges [1,2,3]
Our results demonstrate that the electric breakdown strength (EBDS) value is 1760 kV/cm for the PZT/PZO multilayer films, which is much larger than for the PZT film (EBDS = 1162 kV/cm)
Compared with the PZT and PZO films, the PZT/PZO multilayer films show multiple weak peaks that may be related to the thinner thickness of the single layer
Summary
Dielectric capacitors have received extensive investigation from researchers due to their ability to release and store charges [1,2,3]. Nanomaterials 2021, 11, 2141 where Pm and Pr are the maximum and remanent polarization, E is the external electric field, and Wloss is energy loss density. Heightening the value of Pm –Pr and the electric breakdown strength (EBDS ) can effectively reduce energy loss and improve the Wrec of energy-storage capacitors. Based on the above consideration, we designed the PZT/PZO multilayers by integrating ferroelectric and antiferroelectric materials together to optimize their energy-storage characteristics using the sol–gel method. 1592 kV/cm for PLZT/PZO multilayers and 13 J/cm at 2400 kV/cm for PZT/Al2 O3 /PZT films, our energy-storage density is a little higher under a similar operational electric field; our maximum energy-storage density is not larger than others [7,14,20]. It demonstrates that we need to enhance the electric breakdown strength in the future
Sign-in/Register to view highlights & summary Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
