Abstract
Bilayers of Sm – Co / Fe have been fabricated on 70 nm Cr buffered Si (100) substrate at an elevated temperature of 650°C by the help of DC and RF magnetron sputtering. Very thin layers (0–0.7 nm) of Ti were introduced at the interface of the Sm – Co and Fe phases. The samples were analyzed by X-ray diffraction (XRD) and alternating gradient magnetometer (AGM). All the samples showed strong exchange coupling and single phase behavior. The rise and fall in magnetization and energy product were observed with increasing Ti interlayer thickness. Energy product (BH) max value was found increased by 44% for 0.2 nm Ti interlayer as compared to the sample without Ti layer at interface.
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