Abstract
Characteristics of light emission from mixture of spin-on glass and erbium oxide nanoparticles were investigated. Such erbium-doped silica thin films after furnace annealing have exhibited a strong room temperature photoluminescence (PL) at ∼ 1.53 μm. The PL intensity of the erbium-doped thin film after annealing at 1000 °C was 30 times higher than those after low-temperature annealing. The chemical environment of the erbium ion in the thin film after annealing has been studied by Time-of-Flight Secondary Ion Mass Spectrometry (SIMS). The SIMS result confirmed that Er–O–Si complex was favored and OH group was eliminated in the erbium-doped silica film sample after annealing. Hence we accounted for the PL enhancement of erbium-doped silica by furnace annealing.
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