Abstract
在酸性水溶液中（pH=2.0），采用电化学还原（ER）方法对BiVO 4 薄膜电极进行预处理，并探讨了其对薄膜电极光电化学氧化水性能的影响. 结果表明，这种预处理可显著提高电极的光电化学氧化水的性能，且具有良好的光电化学稳定性. 利用扫描电子显微镜、X射线衍射、拉曼光谱、光电子能谱、紫外-可见漫反射光谱、荧光光谱、电化学阻抗谱及Mott-Schottky等方法对ER处理前后的电极进行了表征. 结果表明，ER预处理使电极粗糙度增大，表面积增大约1.4倍；电极材料的晶型无明显变化，但V—O对称伸缩振动略有红移；表面Bi，V和O结合能变小，Bi 3+ 部分被还原，Bi/V原子比增大；ER处理导致电极平带电位负移，光生载流子在薄膜电极/溶液界面转移速率加快，表面复合速率降低. 这些变化和表面积增加是BiVO 4 电极光电化学性能提高的主要原因.
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