Abstract
The state-selective positive-ion and negative-ion dissociation pathways for gaseous and condensed Si(CH 3) 2Cl 2 following the Cl 2p and Si 2p core-level excitations have been characterized using synchrotron radiation. The Si 2 p → 15 a 1 ∗ excitation of Si(CH 3) 2Cl 2 induces an enhancement of the Cl + desorption yield in the condensed phase and the Si ( CH 3 ) 2 + and SiCH 3 + yields in the gaseous-phase. The Cl −desorption yields are notably enhanced at the 15 a 1 ∗ resonance at both Cl 2p and Si 2p edges. The resonant enhancement of Cl − yield occurs through the formation of highly excited states of the adsorbed molecules. These results provide an insight into the comprehensive understanding of the state-selective fragmentation of molecules via core-level excitation.
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