Abstract

We have measured shear flow and residual structural anisotropy of $\mathrm{Si}{\mathrm{O}}_{2}$ glass uniaxially compressed in a diamond-anvil cell at room temperature with in situ optical-microscope and ex situ x-ray diffraction techniques, respectively. Large shear flow began at $8\ensuremath{-}10\phantom{\rule{0.16em}{0ex}}\mathrm{GPa}$ and continued at least up to 20 GPa, where the macroscopic differential strain reached 70%. Recovered samples after shear flow were in the fully densified state and showed a large microscopic differential strain of 3% only in the intermediate-range network structure. These phenomena may be attributable to the changes in the Si-O bond covalency and the Si-O-Si bond angle with pressure and stresses.

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