Abstract
We report on enhanced longitudinal magnetooptic Kerr effect signal contrast in thin-film nanomagnetic disks with in-plane magnetization when combined with dielectric layers that provide impedance matching to the structure and the underlying substrate. Kerr signals can increase by a factor of three, while substrate reflectance is almost completely suppressed. This leads to an increase in Kerr ellipticity relative to the background intensity and a subsequent improvement in the measured signal-to-noise ratio. Measurements using a beam focused on opaque 400-nm Ni disks yield contrast improvements of a factor of 8. Arrays of nanodisks demonstrate more complex behavior due to diffraction effects
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