Abstract
We study a series of NiFe(10.0nm)/[Ir20Mn80(6.0nm)/Co80Fe20(3.0nm)]N multilayers with different numbers N of bilayers grown by DC magnetron sputtering. After field-cooling, SQUID and MOKE measurements show a sizable increase of the exchange bias field with N. X-ray specular and diffuse scattering data reveal no significant variation of the lateral correlation length and only a weak dependence of the vertical rms interface roughness on N. Atomic and magnetic force microscopy, however, show a strong reduction of the grain size accompanied by distinct changes of the magnetic domain structure. We conclude that the enhancement of the exchange bias effect is related to the shrinking of the domain size in the antiferromagnet due to the structural evolution in the multilayers.
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