Abstract
PbZr0.52Ti0.48O3 thin films on stainless steel substrates were fabricated by an ethylene glycol modified sol–gel method. Perovskite structure of PbZr0.52Ti0.48O3 thin films was examined by the X-ray diffraction analysis. With the increase of ethylene glycol, PbZr0.52Ti0.48O3 thin films with enhanced dielectric and ferroelectric properties were got. Crack-free PbZr0.52Ti0.48O3 thin films with thickness of 1.6 μm were prepared for ethylene glycol content of 50%, and the dielectric permittivity and dielectric loss were 224 and 5.4% respectively at the frequency of 1 kHz showing better dielectric properties compared with PbZr0.52Ti0.48O3 thin films without ethylene glycol modified. The remnant polarization (P r) of 50% content ethylene glycol modified PbZr0.52Ti0.48O3 thin films was nearly twice reaching 12.3 μC/cm2, and lower leakage current density was obtained with 4.6 × 10−6 A· cm−2 under the field of 50 kV· cm−1. Such enhanced performance indicated that the PbZr0.52Ti0.48O3 thin films prepared on stainless steel substrates by the ethylene glycol modified sol–gel process exhibited their potentiality in applications.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
