Abstract
An enhancement of the critical currents in the H‖c configuration, reaching 100% at 77 K, has been obtained in melt textured YBa2Cu3O7/Y2BaCuO5 composites after a cold isostatic pressing process (300 °C, PAr=200 MPa). A transmission electron microscopy analysis of the microstructure demonstrates that a high density of nanometric stacking fault loops, with anisotropic growth within the (001) plane, is generated. The improvement of critical currents is attributed to the flux pinning enhancement due to the increased length of the 1/6〈031〉 partial dislocations surrounding nanometric stacking faults. We stress that this technique has high potential for the large scale processing of high critical currents superconducting ceramic composites.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
