Abstract
The objective here is to present a briefing on the methods and algorithms presented in the field of identifiers and descriptors of key point areas and the manner of obtaining various indicators in order to comply and track the selected objects, compare and reveal their advantages and disadvantages in 2D features in recent decades. Feature detection methods subject to study in this article consist of:Scale-Invariant Feature; Maximally Stable Extremal Regions; Speeded up Robust Features; Features from Accelerated Segment Test; Binary Robust Independent Elementary Features; Efficient Dense Descriptor Applied to Wide-Baseline Stereo; Binary Robust Invariant Scalable Key points; Oriented Binary Robust Independent Elementary Features and Fast Retina Key point.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: International Journal of Advanced Research in Electrical, Electronics and Instrumentation Engineering
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.