Abstract
Pt/Co2MnSi (CMS) multilayered structures capped with high-K dielectric Ta2O5 are sputter-grown and perpendicular magnetic properties are systematically investigated. Strong PMA with the order of 106 erg/cm3 is observed with ultrathin CMS thickness in the range of 0.6∼0.8 nm. An interfacial perpendicular anisotropy energy density of Ks=∼0.52 erg/cm2 is obtained. When the repetition number of Pt/CMS bilayer is greater than two strong PMA can be demonstrated, which may be ascribed to enhanced exchange coupling between CMS layers. In the case of a large repetition number n ≥ 6 switching starting at negative field occurs, indicating nucleation process dominates. Reduced coercivity and saturation magnetization are witnessed in the stacks with increasing thickness of Ta2O5 capping, which can be mainly ascribed to the oxidation effect at the top interface. Our results show perpendicular magnetic properties of Pt/CMS multilayered structures with high-K dielectric Ta2O5 may be engineered for perpendicular spintronic devices.
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