Energy Spectrum of Stochastic Signals Caused by Variations of Electrical Resistance

Abstract

The purpose of the study was to investigate the energy spectrum of stochastic signals caused by the fluctuations of electric resistance of the resistance coils, the metal film resistors and the encephalograms of patients. We have established that all energy spectra of the investigated stochastic signals contain a flicker component that in case of the metal film resistors depends on the defects of their inner structure. We have suggested the reason for the appearance of spectrum flicker-component in the energy spectrum of the stochastic signals of systems of different origin. This reason is the nonequilibrium state of the investigated system. We have shown that it is possible to calculate the flicker noise of the investigated system on any frequencies as well as the flicker noise power, using only two parameters: the value of energy spectrum on the middle and high frequencies (energy spectrum of the equilibrium system) and the relaxation time.