Abstract

A variety of new types of detectors based on wide bandgap materials have been developed for soft X-ray spectroscopy applications(e.g. GaAs, SiC, diamond). In this report we describe the spectroscopicperformance of a simple p-i-n diode fabricated on AlGaAs. The energyresponse of the diode, operating in photon counting mode, at roomtemperature has been investigated using fluorescence from a number of highpurity materials. X-ray spectra over the energy range 5 keV–25 keV showthis type of diode can be used for spectroscopy with promising energyresolution ( ∼ 1.3 keV) at 30°C and excellent linearity.

Highlights

  • A variety of new types of detectors based on wide band gap materials have been developed for soft X-ray spectroscopy applications (e.g. GaAs, SiC, diamond)

  • X-ray spectra over the energy range 5 keV–25 keV show this type of diode can be used for spectroscopy with promising energy resolution (∼ 1.3 keV) at 30◦C and excellent linearity

  • In a number of recent papers we have shown that AlGaAs detectors have many of the attributes, required to survive in relatively harsh environments while offering spectroscopic photon counting imaging

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Summary

AlGaAs diode design and fabrication

2.1 Fabrication Circular mesa Al0.8Ga0.2As diodes of radii 25, 50, 100 and 200 μm were fabricated by photolithography from wafers grown on GaAs n+ substrates by molecular beam epitaxy at the National Centre for III-V Technologies, University of Sheffield, U.K. [10]. 2.1 Fabrication Circular mesa Al0.8Ga0.2As diodes of radii 25, 50, 100 and 200 μm were fabricated by photolithography from wafers grown on GaAs n+ substrates by molecular beam epitaxy at the National Centre for III-V Technologies, University of Sheffield, U.K. Each device had an Au/Zn/Au ohmic contact (annealed at 360◦C) to the top p− GaAs layer. In/Ge/Au alloy was deposited on the back n+ substrate and annealed at 420◦C to provide the ohmic n− metal contact. The capacitance of the 100 μm radius diodes was 5 pC for reverse bias voltages > 5 V. Full depletion of the device was achieved for bias voltages > 5 V. An operating bias voltage of 10 V was chosen to ensure full depletion but to keep the leakage current below 0.1 nA

X-ray measurements
X-ray spectra
Linearity
Efficiency
Conclusions
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