Abstract
The effects of detector resolution and angular broadening on $\ensuremath{\gamma}$-ray Compton-profile anisotropy measurements are studied. Angular broadening limits the experiments to scattering angles near 180\ifmmode^\circ\else\textdegree\fi{}. For such angles, the resolution of the profiles improves with increase in incident photon energy ${E}_{0}$, up to ${E}_{0}\ensuremath{\sim}600$ keV. However, the slight improvement in resolution possible for ${E}_{0}>200$ keV does not produce an appreciable change in the accuracy of the measurements. This is demonstrated by broadening theoretical anisotropy curves with resolution functions appropriate to 60-, 160-, and 500-keV photons scattered at 180\ifmmode^\circ\else\textdegree\fi{}. Although for high-incident-energy photons (${E}_{0}\ensuremath{\gtrsim}2$ MeV) significant improvement in detector resolution is possible for low scattering angles, it is shown that the conditions of high ${E}_{0}$ and low scattering angle produce angular-broadening effects many times as significant as the detector resolution for these cases.
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