Abstract

Silicon design miniaturization has dramatically improved the integration scale in one chip, highlighting in the same time reliability issues. Error-correction mechanisms deal with these issues ensuring the operation Reliability, Availability and Serviceability (RAS), paying a price in performance. The current study deploys a run-time mechanism that mitigates the correction overhead, guaranteeing the performance dependability. In this direction, a closed-loop controller absorbs the RAS-induced delay by triggering Dynamic Voltage and Frequency Scaling (DVFS) schemes. The novelty is the run-time adjustment of the DVFS responses to the identified performance variability norms. To achieve this, we exploit an adaptive scenario scheduler that reorganizes the scenario hierarchy at run-time. Compared against an approach utilizing a 30% operation frequency guardband, the proposed configuration achieves an 83.9% exploitation of the nominal improvement margins that corresponds to an energy gain up to 15%.

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